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Dynamics of photo-excited carriers on GaAs(100) surface studied by ultrafast time-resolved photoemission

発表形態:
原著論文
主要業績:
主要業績
単著・共著:
共著
発表年月:
2009年01月
DOI:
会議属性:
指定なし
査読:
有り
リンク情報:

日本語フィールド

著者:
J. Azuma, S. Tokudomi, K. Takahashi and M. Kamada
題名:
Dynamics of photo-excited carriers on GaAs(100) surface studied by ultrafast time-resolved photoemission
発表情報:
Phys. Stat. Sol. (c) 巻: 6 号: 1 ページ: 307-310
キーワード:
概要:
抄録:
Dynamics of the photo-excited carriers on the GaAs(100) surface have been studied by measuring the surface photo-voltage effect (SPV) with the ultrafast time-resolved photoemission spectroscopy. The fast SPV decay with a few picosecond lifetime has been observed on the n-type GaAs(100) surface. The lifetime of the fast decay component was almost independent with dopant levels, pump powers, and sample temperatures which mainly change the surface potential barrier in the band bending region. This result supports the SPV relaxation model of the hot electron because the time scale of the electron thermalization is considered to be less affected by the change of the surface potential barrier.

英語フィールド

Author:
J. Azuma, S. Tokudomi, K. Takahashi and M. Kamada
Title:
Dynamics of photo-excited carriers on GaAs(100) surface studied by ultrafast time-resolved photoemission
Announcement information:
Phys. Stat. Sol. (c) Vol: 6 Issue: 1 Page: 307-310
An abstract:
Dynamics of the photo-excited carriers on the GaAs(100) surface have been studied by measuring the surface photo-voltage effect (SPV) with the ultrafast time-resolved photoemission spectroscopy. The fast SPV decay with a few picosecond lifetime has been observed on the n-type GaAs(100) surface. The lifetime of the fast decay component was almost independent with dopant levels, pump powers, and sample temperatures which mainly change the surface potential barrier in the band bending region. This result supports the SPV relaxation model of the hot electron because the time scale of the electron thermalization is considered to be less affected by the change of the surface potential barrier.


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