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Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions

発表形態：
一般講演（学術講演を含む）
主要業績：
主要業績
単著・共著：
共著
発表年月：
2022年10月
DOI：
会議属性：
国際会議（国内開催を含む）
査読：
有り
リンク情報：

日本語フィールド

著者：
Muhidul Islam Chaman, Sayleap Sdoeung, and Makoto Kasu 読み: Muhidul Islam Chaman, Sayleap Sdoeung, and Makoto Kasu
題名：
Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions
発表情報：
The 4th International Workshop on Gallium Oxide and Related Materials (IWGO 2022) Nanano, October 23 – 27, 2022
キーワード：
概要：
Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions
抄録：
Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions

英語フィールド

Author：
Muhidul Islam Chaman, Sayleap Sdoeung, and Makoto Kasu
Title：
Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions
Announcement information:
The 4th International Workshop on Gallium Oxide and Related Materials (IWGO 2022) Nanano, October 23 – 27, 2022
An abstract：
Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions
An abstract：
Crystal Defects and Lattice Constants of High-Quality β-Ga2O3 Edge-Defined Film-Fed Grown Single Crystals Studied by Synchrotron X-ray Topography and High-Resolution X-Ray Diffractions

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