MF研究者総覧

教員活動データベース

詳細

High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography

発表形態：
一般講演（学術講演を含む）
主要業績：
主要業績
単著・共著：
共著
発表年月：
2022年10月
DOI：
会議属性：
国際会議（国内開催を含む）
査読：
有り
リンク情報：

日本語フィールド

著者：
Muhidul Islam Chaman, Keigo Hoshikawa, Sayleap Sdoeung, and Makoto Kasu 読み: Muhidul Islam Chaman, Keigo Hoshikawa, Sayleap Sdoeung, and Makoto Kasu
題名：
High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography
発表情報：
The 4th International Workshop on Gallium Oxide and Related Materials (IWGO 2022) Nanano, October 23 – 27, 2022
キーワード：
概要：
High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography
抄録：
High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography

英語フィールド

Author：
Muhidul Islam Chaman, Keigo Hoshikawa, Sayleap Sdoeung, and Makoto Kasu
Title：
High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography
Announcement information:
The 4th International Workshop on Gallium Oxide and Related Materials (IWGO 2022) Nanano, October 23 – 27, 2022
An abstract：
High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography
An abstract：
High Quality Vertical Bridgman and Edge-Defined Film-Fed Growth β-Ga2O3 Bulk Crystal Investigated Using High-Resolution X-Ray Diffraction and Synchrotron X-Ray Topography

Copyright © MEDIA FUSION Co.,Ltd. All rights reserved.