MF研究者総覧

教員活動データベース

詳細

Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography

発表形態：
一般講演（学術講演を含む）
主要業績：
主要業績
単著・共著：
共著
発表年月：
2022年10月
DOI：
会議属性：
国際会議（国内開催を含む）
査読：
有り
リンク情報：

日本語フィールド

著者：
Sayleap Sdoeung, Kohei Sasaki, Katsumi Kawasaki, Jun Hirabayashi, Akito Kuramata, and Makoto Kasu 読み: Sayleap Sdoeung, Kohei Sasaki, Katsumi Kawasaki, Jun Hirabayashi, Akito Kuramata, and Makoto Kasu
題名：
Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography
発表情報：
The 4th International Workshop on Gallium Oxide and Related Materials (IWGO 2022) Nanano, October 23 – 27, 2022
キーワード：
概要：
Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography
抄録：
Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography

英語フィールド

Author：
Sayleap Sdoeung, Kohei Sasaki, Katsumi Kawasaki, Jun Hirabayashi, Akito Kuramata, and Makoto Kasu
Title：
Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography
Announcement information:
The 4th International Workshop on Gallium Oxide and Related Materials (IWGO 2022) Nanano, October 23 – 27, 2022
An abstract：
Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography
An abstract：
Dislocation Responsible for Leakage Current in HVPE (001) β-Ga2O3 SBD Observed by Emission Microscopy and Synchrotron X-ray Topography

Copyright © MEDIA FUSION Co.,Ltd. All rights reserved.