日本語フィールド
著者:N. Chandra, T. Oishi, S.–W. Kim, Yuki Kawamata、Koji Koyama, and M. Kasu 読み: N. Chandra, T. Oishi, S.–W. Kim, Yuki Kawamata、Koji Koyama, and M. Kasu題名:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond Substrates発表情報:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond Substratesキーワード:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond Substrates概要:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond Substrates抄録:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond Substrates英語フィールド
Author:N. Chandra, T. Oishi, S.–W. Kim, Yuki Kawamata、Koji Koyama, and M. KasuTitle:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond SubstratesAnnouncement information:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond SubstratesKeyword:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond SubstratesAn abstract:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond SubstratesAn abstract:High Current (0.7 A/mm) for Diamond MOSFETs with 1.4-µm gate and NO2 P-Type Doping on High Quality Heteroepitaxial Diamond Substrates