日本語フィールド
著者:M. Kasu, K. Hirama, K. Harada, and T. Oishi,題名:“Study on capacitance–voltage characteristics of diamond field-effect transistors with NO2 hole doping and Al2O3 gate insulator layer発表情報:Japanese Journal of Applied Physics 巻: 55 ページ: 041301キーワード:概要:抄録:英語フィールド
Author:M. Kasu, K. Hirama, K. Harada, and T. Oishi,Title:“Study on capacitance–voltage characteristics of diamond field-effect transistors with NO2 hole doping and Al2O3 gate insulator layerAnnouncement information:Japanese Journal of Applied Physics Vol: 55 Page: 041301