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著者:Y. Taniyasu, M. Kasu, and T. Makimoto題名:Increased electron mobility in n-type Si-doped AlN by reducing dislocation density発表情報:Applied Physics Letters 巻: 89 ページ: 182112キーワード:概要:抄録:英語フィールド
Author:Y. Taniyasu, M. Kasu, and T. MakimotoTitle:Increased electron mobility in n-type Si-doped AlN by reducing dislocation densityAnnouncement information:Applied Physics Letters Vol: 89 Page: 182112