日本語フィールド
著者:T.Oishi, K.Shiozawa, K.Sugihara, Y.Abe and Y.Tokuda題名:Protection of field oxide in trench isolation against contact hole etching to improve alignment tolerance発表情報:Jpn. J. Appl. Phys. 37 (1998) pp.L833-L835.キーワード:概要:抄録:英語フィールド
Author:T.Oishi, K.Shiozawa, K.Sugihara, Y.Abe and Y.TokudaTitle:Protection of field oxide in trench isolation against contact hole etching to improve alignment toleranceAnnouncement information:Jpn. J. Appl. Phys. 37 (1998) pp.L833-L835.