日本語フィールド
著者:K.Shiozawa, T.Oishi, Y.Abe, Y.Tokuda題名:Expansion of effective channel width for MOSFETs defined by novel T-shaped shallow trench isolation fabricated with SiON spacers and liners発表情報:Electron. Lett. 36 (2000) pp.910-912.キーワード:概要:抄録:英語フィールド
Author:K.Shiozawa, T.Oishi, Y.Abe, Y.TokudaTitle:Expansion of effective channel width for MOSFETs defined by novel T-shaped shallow trench isolation fabricated with SiON spacers and linersAnnouncement information:Electron. Lett. 36 (2000) pp.910-912.