日本語フィールド
著者:N.Miura, T.Nanjo, M.Suita, T.Oishi, Y.Abe, T.Ozeki, H.Ishikawa, T.Egawa, T.Jimbo題名:Thermal annealing effects on Ni/Au based Schottky contacts on n-GaN and AlGaN/GaN with insertion of high work function metal発表情報:Solid-State Electronics 48 (2004) pp.689–695.キーワード:概要:抄録:英語フィールド
Author:N.Miura, T.Nanjo, M.Suita, T.Oishi, Y.Abe, T.Ozeki, H.Ishikawa, T.Egawa, T.JimboTitle:Thermal annealing effects on Ni/Au based Schottky contacts on n-GaN and AlGaN/GaN with insertion of high work function metalAnnouncement information:Solid-State Electronics 48 (2004) pp.689–695.