日本語フィールド
著者:T.Nanjo, M.Takeuchi, M.Suita, T.Oishi, Y.Abe, Y.Tokuda and Y.Aoyagi題名:Remarkable breakdown voltage enhancement in AlGaN channel high electron mobility transistors発表情報:Appl. Phys. Lett. 92 (2008) 263502.キーワード:概要:抄録:英語フィールド
Author:T.Nanjo, M.Takeuchi, M.Suita, T.Oishi, Y.Abe, Y.Tokuda and Y.AoyagiTitle:Remarkable breakdown voltage enhancement in AlGaN channel high electron mobility transistorsAnnouncement information:Appl. Phys. Lett. 92 (2008) 263502.