日本語フィールド
著者:H. Ezura, K. Ichijo, H. Hasegawa, K. Yamamoto, A. Hotta, T. Suzuki題名:Micro-hardness, microstructures and thermal stability of (Ti,Cr,Al,Si)N films deposited by cathodic arc method発表情報:Vacuum 巻: 82 ページ: 476-481キーワード:概要:抄録:英語フィールド
Author:H. Ezura, K. Ichijo, H. Hasegawa, K. Yamamoto, A. Hotta, T. SuzukiTitle:Micro-hardness, microstructures and thermal stability of (Ti,Cr,Al,Si)N films deposited by cathodic arc methodAnnouncement information:Vacuum Vol: 82 Page: 476-481